standards > terminology artifact > DOI:10.25504/FAIRsharing.q47I0t
Update in progress: note to all users. FAIRsharing is always available for you to search and discover databases, standards and data policies. However, for producers of these resources who maintain or wish to add new records, please note that editing is disabled until September while we migrate our data to our new, improved system. Read our blog post or get in touch with us for more details.

ready CryoEM Ontology

General Information
The CryoEM Ontology for describing objects and workflows in Single Particle Analysis by Cryo Electron Microscopy.


Countries that developed this resource Spain

Created in 2020

Taxonomic range

Knowledge Domains 

How to cite this record CryoEM Ontology; CryoEM Ontology; DOI:; Last edited: April 21, 2021, 12:57 p.m.; Last accessed: Sep 16 2021 11:14 a.m.

This record is maintained by

Record added: Oct. 5, 2020, 12:21 p.m.
Record updated: March 17, 2021, 10:48 a.m. by The FAIRsharing Team.

Show edit history


No support information provided.

Additional Information



No XSD schemas defined

Access / Retrieve Data

Conditions of Use

Applies to: Data use

Data Release

Data Access


No publications available

Related Standards

Reporting Guidelines

No guidelines defined

Terminology Artifacts

No semantic standards defined

Identifier Schemas

No identifier schema standards defined


No metrics standards defined

Related Databases (1)
Scipion Workflow Repository
Repository of workflows for image processing in cryo-electron microscopy using Scipion.

Implementing Policies

This record is not implemented by any policy.


Record Maintainer